English | ISBN: 9811010722 | 2017 | 220 Pages | PDF, EPUB | 19 MB This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstra...
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Here you can download High-level Estimation and Exploration of Reliability for Multi-Processor Sys book in PDF, MOBI, EPUB or Amazon Kindle ready format as AZW3 free and full. Ro4S2rnQNx
Category: Electronics | Release Date: 20 Oct 2017
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